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Ideal for measuring the IV characteristics of semiconductors and materials.
This product is software for automatically measuring the "IV characteristics" (current-voltage characteristics) of semiconductors and materials using commercially available measuring instruments.
High-precision measurements are possible!
A series of measurements are programmed on National Instruments' LabVIEW, and the calculation of measurement values is performed almost instantaneously. The no-load Q value, which is the measurement result, is displayed on the control computer in almost real-time, and the data is saved as a text file. The limiting factor for the measurements is the measurement time of the network analyzer, and particularly in this software, reflection measurements are performed in addition to the usual transmission measurements, so the measurements take several seconds. Therefore, please pay attention to temperature changes in the resonator during the measurements.
